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within IC manufacturing facilities
Electrostatic discharge (ESD) damages both products and reticles
leadframe stampers and mold manufacturers
本文書の目的は，半導体産業で使用されるジメチルスルホキシドに対する要求事項を標準化し，また，要求事項に対して立証するためのテスト手順を標準化することである。このテスト方法は統計的に有効な結果を表すことが明らかとなっている。
This Test Method is especially applicable for silicon where boron is an unintentional p-type contaminant at trace levels (<5 × 1014 atoms/cm3)
Flex Electronics Webinar Master Class 27: November 5, 2025 Recording StdPbc-811 within IC manufacturing facilitiesRecording of the Flex Electronics Master Class: Digital Twin Models for Semiconductor Manufacturing Unit Process CANCELLATION POLICY: This is recording of an on line event. You will receive the access information upon completion of the registration. We are not processing refunds or cancellations. EVENT CONTACT: Basak Ulutas Ozturkler Email: bulutas@semi. org